The XR-Spec is a complete package designed for high resolution X-ray spectrometry.
The package is composed by the following main parts:
- Silicon Drift Detector (SDD)
- Multi Channel Analyzer (MCA)
- Analysis software
The XR-SPEC exploits the best features of each component gathering them in a complete package perfect for high-resolution X-ray spectrometry.
SILICON DRIFT DETECTOR (SDD)
For all types of X-Ray Fluorescence applications, SDD detectors offer high spectral quality, excellent resolution, and high peak to background ratios over a wide energy range.
Excellent peak to background performance is achieved over a wide range of x-ray acceptance angles by means of ‘on-chip’ internal collimators.
MULTI CHANNEL ANALYZER (MCA)
Topaz-X is an advanced, fully digital, compact Multi Channel Analyzer used to process the electronic pulses produced by a high resolution, electrically cooled silicon detector such as Silicon drift detector (SDD).
The MCA implements several advanced modes of data acquisition, such as: Pulse Height Analysis (PHA), Multi-channel scaling (MCS), LIST and Time LIST mode (TLIST).
bAxil is a new software for the XRF spectrum analysis.
Although it is based on the internationally well know AXIL spectrum analysis methods, it incorporates recent developments and research in spectrum analysis and peak deconvolution.
bAxil has been developed using the most recent and powerful software development and programming techniques.